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加田 渉; 佐藤 隆博; 岩本 直也; 小野田 忍; 牧野 高紘; 江夏 昌志; 大島 武; 神谷 富裕
no journal, ,
Thin film Transmission diamond detector is now under development for the detection of single-ion-hit of MeV energy range ions. The radiation hardness of the detector needs to be investigated. The effect of the damage produced on the impact of high-energy heavy ions was evaluated by using Transient Ion Beam Induced Current (TIBIC) analysis system. The differences in the signals were obtained before and after the intense microbeam irradiation on the area of 50
50 
m
through the comparison of the peak current and integral total charges of each single pulses induced by the single ion hit of 15 MeV O
.
神谷 富裕; 加田 渉; 江夏 昌志; 岩本 直也; 小野田 忍; 牧野 高紘; 大島 武
no journal, ,
In TIARA, an ion microbeam system was developed for a study on irradiation effects of living cells. In order to perform cell irradiation in the atmosphere using high energy heavy ions more accurately and more efficiently, it was proposed that the material of the thin film vacuum windows of the single ion hit system be replaced to that acting as a transmission type particle detector. Diamond films has been selected as the material because it has enough mechanical strength as well as the characteristic as a wide band-gap semiconductor which can operate with low noise in room temperature and also under lighting of optical microscope observation. The plan of this development will be over-viewed in the presentation.
小野田 忍; 阿部 浩之; 山本 卓; 大島 武; 磯谷 順一*; 寺地 徳之*; 渡邊 賢司*
no journal, ,
The Ion Photon Emission Microscopy (IPEM) gives us two-dimensional maps of Single Event Effects (SEEs). To observe the map, the position where the single ion strikes a scintillator placed over a microelectronics circuit is recorded together with SEE signal. Since the spatial resolution is determined by the spot size and the intensity of the Ion Beam Induced Luminescence (IBIL), the scintillator is one of the most important parts of IPEM. In this study, we propose that the diamond containing Nitrogen Vacancy (NV) centers can be used as a scintillator. The results obtained from diamond were compared to those of YAG:Ce. For both cases, the averaged spot size of a few micrometers is observed. The IBIL intensity from diamond is 4 times higher than that from YAG:Ce. According to these results, we suggest that diamond containing NV centers is a rival candidate of YAG:Ce from the point of view of single ion detection with high spatial resolution.
大島 武; 小野田 忍; 牧野 高紘; 岩本 直也; 出来 真斗; 加田 渉; 神谷 富裕
no journal, ,
イオンビーム誘起電荷(IBIC)は粒子検出器の品質を判断するのに有効な評価手法であるが、評価中にイオン入射により発生する結晶欠陥により品質が低下し電荷収集効率(CCE)が減少するという問題がある。粒子検出器の特性評価には、CCEの正確な評価が不可欠であり、単一イオン入射イオンビーム誘起過渡電流(TIBIC)測定技術が有効となる。原子力機構高崎量子応用研究所のイオン照射研究施設(TIARA)では、重イオンマイクロビームを用いた単一イオン入射TIBIC評価技術の開発に成功している。シリコン,炭化ケイ素,ダイヤモンドダイオードを用いたTIBIC評価について紹介する。